Mahroo Zandrahimi

PhD student at the Computer Engineering Group of the Faculty of Engineering, Mathematics and Computer Science (EEMCS/EWI), Delft University of Technology. She completed her B.Sc. in Computer Engineering at Shahid Beheshti University of Iran, and M. Sc. in Computer Architecture at Amirkabir University of Technology, both with honors. In April 2013, she joined the Computer Engineering Lab of the Delft University of Technology, where she is working under the supervision of Dr. Zaid Al-Ars.

Projects

I am currently involved in the BENEFIC project, which stands for Best ENergy EFficiency solutions for heterogeneous multI-core Communicating systems.

My research in BENEFIC involves proposing adaptive design processes to accommodate to the inaccuracies in cutting-edge manufacturing technologies.

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    2018

  1. M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, An Industrial Case Study of Low Cost Adaptive Voltage Scaling Using Delay Test Patterns (to appear: March 2018), Design, Automation and Test in Europe (DATE 2018), 19-23 March 2018, Dresden, Germany [Conference Proceedings]
  2. M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Industrial Evaluation of Transition Fault Testing for Cost Effective Offline Adaptive Voltage Scaling (to appear: March 2018), Design, Automation and Test in Europe (DATE 2018), 19-23 March 2018, Dresden, Germany [Conference Proceedings]
  3. 2017

  4. M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Transition Fault Testing for Offline Adaptive Voltage Scaling1638_transition_fault_testing_for_offline_adaptive_voltage_scali.pdf (to appear: October 2017), International Test Conference (ITC 2017), 31 October - 2 November 2017, Fort Worth, USA [Conference Proceedings]
  5. M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Using Transition Fault Test Patterns for Cost Effective Offline Performance Estimation1620_using_transition_fault_test_patterns_for_cost_effective_off.pdf (April 2017), 12th International Conference on Design &Technology of Integrated Systems in Nanoscale Era (DTIS 2017), 4-6 April 2017, Palma de Mallorca, Spain [Conference Paper]
  6. 2016

  7. M. Zandrahimi, A. Castillejo, P. Debaud, Z. Al-Ars, Industrial Approaches for Performance Evaluation Using On-Chip Monitors1561_industrial_approaches_for_performance_evaluation_using_onc.pdf (December 2016), 11th IEEE International Design & Test Symposium (IDT 2016), 18-20 December 2016, Hammamet, Tunisia [Conference Paper]
  8. M. Zandrahimi, Z. Al-Ars, P. Debaud, A. Castillejo, Challenges of Using On-Chip Performance Monitors for Process and Environmental Variation Compensation1522_challenges_of_using_onchip_performance_monitors_for_proces.pdf (March 2016), Design, Automation and Test in Europe (DATE 2016), 14-18 March 2016, Dresden, Germany [Conference Proceedings]
  9. 2014

  10. M. Zandrahimi, Z. Al-Ars, A Survey on Low-Power Techniques for Single and Multicore Systems1449_a_survey_on_lowpower_techniques_for_single_and_multicore_s.pdf (October 2014), 3rd International Conference on Context-Aware Systems and Applications (ICCASA 2014), 15-16 October 2014, Dubai, United Arab Emirates [Conference Paper]
  11. 2013

  12. M. Zandrahimi, Z. Al-Ars, An Overview of Power Reduction Techniques for Single and Multicore Systems1433_an_overview_of_power_reduction_techniques_for_single_and_mu.pdf (November 2013), ICT.OPEN 2013, 27-28 November 2013, Eindhoven, The Netherlands [Conference Paper]
  13. 2012

  14. M. Zandrahimi, H.R. Zarandi, M. H. Mottaghi, Two Effective Methods to Detect Anomalies in Embedded Systems1621_two_effective_methods_to_detect_anomalies_in_embedded_syste.pdf (January 2012), Microelectronics Journal, volume 43, issue 1 [Journal Paper]
  15. 2010

  16. M. Zandrahimi, H.R. Zarandi, A. Zarei, A Probabilistic Method to Detect Anomalies in Embedded Systems1622_a_probabilistic_method_to_detect_anomalies_in_embedded_syst.pdf (October 2010), 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010), 6-8 October 2010, Kyoto, Japan [Conference Paper]